Event Details
Design for Manufacturability and Reliability in Extreme CMOS Scaling and Beyond
Presenter: Dr. David Z. Pan - Professor, Department of Electrical and Computer Engineering, University of Texas at Austin, Austin, Texas, United States
Supervisor: IEEE 樱花影视 Section
Date: Mon, July 22, 2013
Time: 13:30:00 - 15:00:00
Place: EOW 430
ABSTRACT